[Acc_sem_comm] [EXTERNAL] Accelerator Seminar: Tamin Tai

[Tristan Jones via BlueJeans Network]

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Meeting ID: 190 924 996

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Meeting ID: 190 924 996
Description:
Loss Mechanisms on Superconducting Quantum Devices and Microwave Microscopy for Probing Superconducting Devices Metrology

ABSTRACT

In this talk, I will focus on the loss mechanisms in our superconducting resonators and qubits. Then I will discuss two types of novel metrology inspection tools, the laser scanning microwave microscope (LSM) and the scanning probe (magnetic writer) microwave microscopy to explore the surface metrology and defects on high quality superconducting cavities’ materials. Both microscopies can image the distribution of RF/microwave currents at the surface of many superconducting resonators and creates an image of RF/microwave currents.

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