[d2n-analysis-talk] PR Electron Detection & Cut Efficiencies (2)
David Flay
flay at jlab.org
Mon Jan 11 11:44:16 EST 2010
Hi all,
I forgot to mention -- the fairly large drop in efficiency in going from
pure detection efficiency (in the table) to the two plots concerning cut
efficiencies is due in part to the fact that the knock on electrons are
excluded from the get-go in the cut efficiency study. That is, my
starting cut position is placed to the right of the knock-on peak, and
hence, these events are excluded. Thus, we can see the contamination here
is on the level of 2-3%.
Dave
-------------------------------------------------
David Flay
Physics Department
Temple University
Philadelphia, PA 19122
office: Barton Hall, BA319
phone: (215) 204-1331
e-mail: flay at jlab.org
david.flay at temple.edu
website: http://www.jlab.org/~flay
-------------------------------------------------
More information about the d2n-analysis-talk
mailing list